|
| << previous |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 12 of 12 found articles
| Title: |
Wrinkle-Based Measurement of Elastic Modulus of Nano-Scale Thin Pt Film Deposited on Polymeric Substrate: Verification and Uncertainty Analysis |
| Author: |
Choi, H-J. Kim, J-H. Lee, H-J. Song, S-A. Lee, H-J. Han, J-H. Moon, M-W. |
| Appeared in: |
Experimental mechanics |
| Paging: | Volume 50 (2009) nr. 5 pages 635-641 |
| Year: |
2009 |
| Contents: | |
| Publisher: |
Springer US, Boston |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 12 of 12 found articles
| << previous |