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Journal description
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Details for article 1 of 14 found articles
| Title: |
A New Method for Measuring Displacements of Micro Devices by an Optical Encoding System |
| Author: |
Ben-David, E. Kanner, O. Shilo, D. |
| Appeared in: |
Experimental mechanics |
| Paging: | Volume 49 (2008) nr. 6 pages 823-827 |
| Year: |
2008 |
| Contents: | |
| Publisher: |
Springer US, Boston |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 1 of 14 found articles
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