X-ray Diffraction Analysis of the Structure In0.53Ga0.47As Films Grown on (100) and (111)A GaAs Substrates with a Metamorphic Buffer
Titel:
X-ray Diffraction Analysis of the Structure In0.53Ga0.47As Films Grown on (100) and (111)A GaAs Substrates with a Metamorphic Buffer
Auteur:
Folomeshkin, M. S. Volkovsky, Yu. A. Prosekov, P. A. Galiev, G. B. Klimov, E. A. Klochkov, A. N. Pushkarev, S. S. Seregin, A. Yu. Pisarevsky, Yu. V. Blagov, A. E. Kovalchuk, M. V.