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                                       Details for article 30 of 35 found articles
 
 
  Structural characteristics of multicomponent GaAs-InxGa1-xAs system from double-crystal X-ray diffractometry data
 
 
Title: Structural characteristics of multicomponent GaAs-InxGa1-xAs system from double-crystal X-ray diffractometry data
Author: Afanas’ev, A. M.
Chuev, M. A.
Imamov, R. M.
Lomov, A. A.
Appeared in: Crystallography reports
Paging: Volume 45 (2000) nr. 4 pages 655-660
Year: 2000
Contents:
Publisher: Nauka/Interperiodica, Moscow
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 30 of 35 found articles
 
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