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Journal description
All volumes of the corresponding journal
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Details for article 5 of 12 found articles
| Title: |
Calibration and validation of coarse-grained models of atomic systems: application to semiconductor manufacturing |
| Author: |
Farrell, Kathryn Oden, J. Tinsley |
| Appeared in: |
Computational mechanics |
| Paging: | Volume 54 (2014) nr. 1 pages 3-19 |
| Year: |
2014 |
| Contents: | |
| Publisher: |
Springer Berlin Heidelberg, Berlin/Heidelberg |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 5 of 12 found articles
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