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Journal description
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Details for article 53 of 92 found articles
| Title: |
Low-temperature scanning tunneling microscopy and near-edge X-ray absorption fine structure investigation of epitaxial growth of F16CuPc thin films on graphite |
| Author: |
Huang, Yu Li Chen, Wei Chen, Shi Wee, Andrew Thye Shen |
| Appeared in: |
Applied physics. Part A, Materials science and processing |
| Paging: | Volume 95 (2008) nr. 1 pages 107-111 |
| Year: |
2008 |
| Contents: | |
| Publisher: |
Springer-Verlag, Berlin/Heidelberg |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 53 of 92 found articles
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