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Journal description
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Details for article 12 of 43 found articles
| Title: |
Depth-resolved X-ray determination of surface strain in free-standing films of HVPE-grown GaN and 71Ga NMR characterization |
| Author: |
Mahadik, N.A. Qadri, S.B. Rao, M.V. Yesinowski, J.P. |
| Appeared in: |
Applied physics. Part A, Materials science and processing |
| Paging: | Volume 86 () nr. 1 pages 67-71 |
| Year: |
2006-10-18 |
| Contents: | |
| Publisher: |
Springer-Verlag, Berlin/Heidelberg |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 12 of 43 found articles
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