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                                       Details for article 12 of 26 found articles
 
 
  Impact of nickel contamination on carrier recombination in n- and p-type crystalline silicon wafers
 
 
Title: Impact of nickel contamination on carrier recombination in n- and p-type crystalline silicon wafers
Author: Macdonald, D.
Appeared in: Applied physics. Part A, Materials science and processing
Paging: Volume 81 (2005) nr. 8 pages 1619-1625
Year: 2005
Contents:
Publisher: Springer-Verlag, Berlin/Heidelberg
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 12 of 26 found articles
 
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