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                                       Details for article 41 of 50 found articles
 
 
  Structural characterization and optoelectronic properties of GaN thin films on Si(111) substrates using pulsed laser deposition assisted by gas discharge
 
 
Title: Structural characterization and optoelectronic properties of GaN thin films on Si(111) substrates using pulsed laser deposition assisted by gas discharge
Author: Tong, X.L.
Zheng, Q.G.
Hu, S.L.
Qin, Y.X.
Ding, Z.H.
Appeared in: Applied physics. Part A, Materials science and processing
Paging: Volume 79 (2003) nr. 8 pages 1959-1963
Year: 2003
Contents:
Publisher: Springer Berlin Heidelberg, Berlin/Heidelberg
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 41 of 50 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands