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Details for article 6 of 84 found articles
| Title: |
Comparative investigation of Co, Fe, Ni ion and protons radiation damage in oxide optimized Si-MOS capacitive radiation sensor using Monte Carlo simulation |
| Author: |
Anjankar, Shubham Dhavse, Rasika Yadav, Shivendra |
| Appeared in: |
Applied physics. Part A, Materials science and processing |
| Paging: | Volume 131 () nr. 1 pages xx |
| Year: |
2024-12-23 |
| Contents: | |
| Publisher: |
Springer Berlin Heidelberg, Berlin/Heidelberg |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 6 of 84 found articles
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