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                                       Details for article 10 of 104 found articles
 
 
  Comparison of C face (000 1¯) and Si face (0001) of silicon carbide wafers in femtosecond laser irradiation assisted chemical–mechanical polishing process
 
 
Title: Comparison of C face (000 1¯) and Si face (0001) of silicon carbide wafers in femtosecond laser irradiation assisted chemical–mechanical polishing process
Author: Chen, Yuan-Di
Liu, Hsiang-Yi
Cheng, Chiao-Yang
Chen‬, ‬Chih-Chun
Appeared in: Applied physics. Part A, Materials science and processing
Paging: Volume 128 () nr. 12 pages xx
Year: 2022-11-21
Contents:
Publisher: Springer Berlin Heidelberg, Berlin/Heidelberg
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 10 of 104 found articles
 
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