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Details for article 68 of 87 found articles
| Title: |
Spectroscopic ellipsometry characterization of amorphous Se100-xTex films using the Cody–Lorentz parameterized model |
| Author: |
Abdel-Wahab, F. Badawi, Ali Al-yami, A. A. F. Mahasen, M. M. |
| Appeared in: |
Applied physics. Part A, Materials science and processing |
| Paging: | Volume 127 () nr. 7 pages xx |
| Year: |
2021-06-17 |
| Contents: | |
| Publisher: |
Springer Berlin Heidelberg, Berlin/Heidelberg |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 68 of 87 found articles
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