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Journal description
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Details for article 83 of 89 found articles
| Title: |
Total ionization dose effects of N-type tunnel field effect transistor (TFET) with ultra-shallow pocket junction |
| Author: |
Xi, Kai Bi, Jinshun Chu, Jiamin Xu, Gaobo Li, Bo Wang, Haibin Liu, Ming Sandip, Majumdar |
| Appeared in: |
Applied physics. Part A, Materials science and processing |
| Paging: | Volume 126 () nr. 6 pages xx |
| Year: |
2020-05-22 |
| Contents: | |
| Publisher: |
Springer Berlin Heidelberg, Berlin/Heidelberg |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 83 of 89 found articles
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