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Journal description
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Details for article 198 of 198 found articles
| Title: |
XUV laser mass spectrometry for nano-scale 3D elemental profiling of functional thin films |
| Author: |
Bleiner, D. Trottmann, M. Cabas-Vidani, A. Wichser, A. Romanyuk, Y. E. Tiwari, A. N. |
| Appeared in: |
Applied physics. Part A, Materials science and processing |
| Paging: | Volume 126 () nr. 3 pages xx |
| Year: |
2020-02-26 |
| Contents: | |
| Publisher: |
Springer Berlin Heidelberg, Berlin/Heidelberg |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 198 of 198 found articles
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