|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 12 of 64 found articles
| Title: |
Effects of thermal oxidation duration on the structural and electrical properties of Nd2O3/Si system |
| Author: |
Hetherin, Karuppiah Ramesh, S. Wong, Yew Hoong |
| Appeared in: |
Applied physics. Part A, Materials science and processing |
| Paging: | Volume 123 (2017) nr. 8 pages 1-11 |
| Year: |
2017 |
| Contents: | |
| Publisher: |
Springer Berlin Heidelberg, Berlin/Heidelberg |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 12 of 64 found articles
| << previous | next >> |