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Journal description
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Details for article 17 of 50 found articles
| Title: |
FTIR absorption spectroscopy as a novel method for thin film deposition rate measurement |
| Author: |
Reichenbacher, Thomas Schuetz, Simon Stasewitsch, Ilja Fabig, Stephan |
| Appeared in: |
Applied physics. Part A, Materials science and processing |
| Paging: | Volume 114 (2013) nr. 4 pages 1295-1301 |
| Year: |
2013 |
| Contents: | |
| Publisher: |
Springer Berlin Heidelberg, Berlin/Heidelberg |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 17 of 50 found articles
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