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Journal description
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Details for article 9 of 37 found articles
| Title: |
Ellipsometry studies of Si/Ge superlattices with embedded Ge dots |
| Author: |
Kalem, Şeref Arthursson, Örjan Werner, Peter |
| Appeared in: |
Applied physics. Part A, Materials science and processing |
| Paging: | Volume 112 (2013) nr. 3 pages 555-559 |
| Year: |
2013 |
| Contents: | |
| Publisher: |
Springer Berlin Heidelberg, Berlin/Heidelberg |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 9 of 37 found articles
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