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Magnetization reversal studies of continuous and patterned exchange biased NiFe/FeMn thin films |
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Title: |
Magnetization reversal studies of continuous and patterned exchange biased NiFe/FeMn thin films |
Author: |
Mohanty, J. Vandezande, S. Brems, S. Bael, M. J. Van Charlton, T. Langridge, S. Dalgliesh, R. M. Temst, K. Haesendonck, C. Van |
Appeared in: |
Applied physics. Part A, Materials science and processing |
Paging: |
Volume 109 (2012) nr. 1 pages 181-187 |
Year: |
2012 |
Contents: |
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Publisher: |
Springer-Verlag, Berlin/Heidelberg |
Source file: |
Elektronische Wetenschappelijke Tijdschriften |
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