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Details for article 32 of 34 found articles
| Title: |
Uniformity study of wafer-scale InP-to-silicon hybrid integration |
| Author: |
Liang, Di Chapman, David C. Li, Youli Oakley, Douglas C. Napoleone, Tony Juodawlkis, Paul W. Brubaker, Chad Mann, Carl Bar, Hanan Raday, Omri Bowers, John E. |
| Appeared in: |
Applied physics. Part A, Materials science and processing |
| Paging: | Volume 103 (2010) nr. 1 pages 213-218 |
| Year: |
2010 |
| Contents: | |
| Publisher: |
Springer-Verlag, Berlin/Heidelberg |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 32 of 34 found articles
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