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                                       Details for article 8 of 9 found articles
 
 
  Identifying the critical cut-points of a quality control process for serological assays: results from parametric and semiparametric regression models
 
 
Title: Identifying the critical cut-points of a quality control process for serological assays: results from parametric and semiparametric regression models
Author: Wand, Handan
Dimech, Wayne
Freame, Robert
Smeh, Kathy
Appeared in: Accreditation and quality assurance
Paging: Volume 22 (2017) nr. 4 pages 191-198
Year: 2017
Contents:
Publisher: Springer Berlin Heidelberg, Berlin/Heidelberg
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 8 of 9 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands