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Journal description
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Details for article 3 of 20 found articles
| Title: |
Development and Certification of NIST Standard Reference Materials for Relative Raman Intensity Calibration |
| Author: |
Etz, Edgar S. Choquette, Steven J. Hurst, Wilbur S. |
| Appeared in: |
Microchimica acta : micro and trace analysis |
| Paging: | Volume 149 (2005) nr. 3-4 pages 175-184 |
| Year: |
2005 |
| Contents: | |
| Publisher: |
Springer-Verlag, Vienna |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 3 of 20 found articles
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