XRF Analysis of Microsamples of Semiconductor Type Multielement Materials by the Thin Layer Method. Determination of Cr, Co, Ni, Cu, Zn, Ga, Se, Sb, Yb
Titel:
XRF Analysis of Microsamples of Semiconductor Type Multielement Materials by the Thin Layer Method. Determination of Cr, Co, Ni, Cu, Zn, Ga, Se, Sb, Yb
Auteur:
Jurczyk, Jerzy Sitko, RafaĆ Zawisza, Beata Buhl, Franciszek Malicka, Ewa