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                                       Details for article 11 of 12 found articles
 
 
  The Assessment of Interface Adhesion of Cu/Ta/Black Diamondâ„¢/Si Films Stack Structure by Nanoindentation and Nanoscratch Tests
 
 
Title: The Assessment of Interface Adhesion of Cu/Ta/Black Diamondâ„¢/Si Films Stack Structure by Nanoindentation and Nanoscratch Tests
Author: Liao, Chenglong
Guo, Dan
Wen, Shizhu
Lu, Xinchun
Pan, Guoshun
Luo, Jianbin
Appeared in: Tribology letters
Paging: Volume 53 (2013) nr. 2 pages 401-410
Year: 2013
Contents:
Publisher: Springer US, Boston
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 11 of 12 found articles
 
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