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                                       Details for article 5 of 8 found articles
 
 
  Transmission Electron Microscopy Analysis of Mo–W–S–Se Film Sliding Contact Obtained by Using Focused Ion Beam Microscope and In Situ Microtribometer
 
 
Title: Transmission Electron Microscopy Analysis of Mo–W–S–Se Film Sliding Contact Obtained by Using Focused Ion Beam Microscope and In Situ Microtribometer
Author: Hu, J. J.
Wheeler, R.
Zabinski, J. S.
Shade, P. A.
Shiveley, A.
Voevodin, A. A.
Appeared in: Tribology letters
Paging: Volume 32 (2008) nr. 1 pages 49-57
Year: 2008
Contents:
Publisher: Springer US, Boston
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 5 of 8 found articles
 
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