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Journal description
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Details for article 7 of 16 found articles
| Title: |
Histogram Measurement of ADC Nonlinearities by Using Incomplete-Scale Sine Waves |
| Author: |
Rybakov, A. A. Reznichenko, N. E. |
| Appeared in: |
Russian microelectronics |
| Paging: | Volume 48 () nr. 7 pages 452-456 |
| Year: |
2020-03-10 |
| Contents: | |
| Publisher: |
Pleiades Publishing, Moscow |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 7 of 16 found articles
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