|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 8 of 9 found articles
| Title: |
Rational methodological approach to evaluation of dose resistance of CMOS microcircuits with respect to low intensity effects |
| Author: |
Boychenko, D. V. Kalashnikov, O. A. Karakozov, A. B. Nikiforov, A. Yu. |
| Appeared in: |
Russian microelectronics |
| Paging: | Volume 44 (2015) nr. 1 pages 1-7 |
| Year: |
2015 |
| Contents: | |
| Publisher: |
Pleiades Publishing, Moscow |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 8 of 9 found articles
| << previous | next >> |