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                                       Details for article 6 of 8 found articles
 
 
  Simulation of the local effect of nuclear particles on 65-nm CMOS DICE memory cells
 
 
Title: Simulation of the local effect of nuclear particles on 65-nm CMOS DICE memory cells
Author: Stenin, V. Ya.
Stepanov, P. V.
Appeared in: Russian microelectronics
Paging: Volume 41 (2012) nr. 4 pages 231-238
Year: 2012
Contents:
Publisher: SP MAIK Nauka/Interperiodica, Dordrecht
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 6 of 8 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands