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Journal description
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Details for article 8 of 8 found articles
| Title: |
Probe modification for scanning-probe microscopy by the focused ion beam method |
| Author: |
Konoplev, B. G. Ageev, O. A. Smirnov, V. A. Kolomiitsev, A. S. Serbu, N. I. |
| Appeared in: |
Russian microelectronics |
| Paging: | Volume 41 (2012) nr. 1 pages 41-50 |
| Year: |
2012 |
| Contents: | |
| Publisher: |
SP MAIK Nauka/Interperiodica, Dordrecht |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 8 of 8 found articles
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