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Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 6 of 9 found articles
| Title: |
On the issue of an equivalent oxide thickness evaluation in nanoscale MISFETs |
| Author: |
Krasnikov, G. Ya. Zaitsev, N. A. Matyushkin, I. V. |
| Appeared in: |
Russian microelectronics |
| Paging: | Volume 40 (2011) nr. 1 pages 25-30 |
| Year: |
2011 |
| Contents: | |
| Publisher: |
SP MAIK Nauka/Interperiodica, Dordrecht |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 6 of 9 found articles
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