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Journal description
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Details for article 9 of 20 found articles
| Title: |
Integrated Laser Measuring System for the Ellipsometric and Photovoltage Characterization of Thin Surface Layers |
| Author: |
V. A. Kotenev |
| Appeared in: |
Russian microelectronics |
| Paging: | Volume 32 (2003) nr. 6 pages 6 p. |
| Year: |
2003-11/12-/12 |
| Contents: | |
| Publisher: |
Kluwer Academic/Plenum Publishers, New York, U.S.A. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 9 of 20 found articles
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