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                                       Details for article 1 of 22 found articles
 
 
  Annealing of Radiation and Electrostatic-Discharge Damages in Semiconductor Devices
 
 
Title: Annealing of Radiation and Electrostatic-Discharge Damages in Semiconductor Devices
Author: M. I. Gorlov
D. A. Litvinenko
Appeared in: Russian microelectronics
Paging: Volume 31 (2002) nr. 5 pages 10 p.
Year: 2002-09/10-/10
Contents:
Publisher: Kluwer Academic/Plenum Publishers, New York, U.S.A.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

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 Koninklijke Bibliotheek - National Library of the Netherlands