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Journal description
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Details for article 3 of 14 found articles
| Title: |
Characterization of a Quantum Well in an Si/Si1xGex/Si Heterostructure by X-ray Diffractometry |
| Author: |
A. M. Afanas'ev A. P. Boltaev R. M. Imamov E. Kh. Mukhamedzhanov M. M. Rzaev M. A. Chuev |
| Appeared in: |
Russian microelectronics |
| Paging: | Volume 31 (2001) nr. 1 pages 6 p. |
| Year: |
2001-01/02-/02 |
| Contents: | |
| Publisher: |
Kluwer Academic/Plenum Publishers, New York, U.S.A. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 3 of 14 found articles
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