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                                       Details for article 4 of 26 found articles
 
 
  International Scientific and Engineering Conference Sensor Electronics and Microsystem Technologies (SEMST-1) with Exhibition of Sensor Developments and Production Samples
 
 
Title: International Scientific and Engineering Conference Sensor Electronics and Microsystem Technologies (SEMST-1) with Exhibition of Sensor Developments and Production Samples
Author:
Appeared in: Russian journal of nondestructive testing
Paging: Volume 39 (2003) nr. 6 pages 493-495
Year: 2003
Contents:
Publisher: Kluwer Academic Publishers-Plenum Publishers, New York
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 4 of 26 found articles
 
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