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Journal description
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Details for article 14 of 18 found articles
| Title: |
Retrieval of the Characteristics and Determination of the Parameters of Statistical Nanometer Surface Roughness using the Data on Scattering in a Planar Optical Waveguide in the Presence of Additive Noise |
| Author: |
Egorov, A. A. |
| Appeared in: |
Radiophysics and quantum electronics |
| Paging: | Volume 45 (2002) nr. 7 pages 527-533 |
| Year: |
2002 |
| Contents: | |
| Publisher: |
Kluwer Academic Publishers-Plenum Publishers, New York |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 14 of 18 found articles
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