|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 17 of 26 found articles
| Title: |
Evaluation of optical parameters and characterization of few layer sputtered MoS2 film by spectroscopic ellipsometry |
| Author: |
Singh, Richa Tripathi, Shweta |
| Appeared in: |
Optical and quantum electronics |
| Paging: | Volume 51 (2019) nr. 10 pages 1-16 |
| Year: |
2019 |
| Contents: | |
| Publisher: |
Springer US, New York |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 17 of 26 found articles
| << previous | next >> |