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A new approach to modelling Kelvin probe force microscopy of hetero-structures in the dark and under illumination |
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Titel: |
A new approach to modelling Kelvin probe force microscopy of hetero-structures in the dark and under illumination |
Auteur: |
Huang, Yong Gheno, Alexandre Rolland, Alain Pedesseau, Laurent Vedraine, Sylvain Durand, Olivier Bouclé, Johann Connolly, James P. Etgar, Lioz Even, Jacky |
Verschenen in: |
Optical and quantum electronics |
Paginering: |
Jaargang 50 (2018) nr. 1 pagina's 1-10 |
Jaar: |
2018 |
Inhoud: |
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Uitgever: |
Springer US, New York |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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