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  A comprehensive model for transient behavior of tapping mode atomic force microscope
 
 
Title: A comprehensive model for transient behavior of tapping mode atomic force microscope
Author: Keyvani, Aliasghar
Tamer, Mehmet Selman
Wingerden, Jan-Willem van
Goosen, J. F. L.
Keulen, Fred van
Appeared in: Nonlinear dynamics
Paging: Volume 97 (2019) nr. 2 pages 1601-1617
Year: 2019
Contents:
Publisher: Springer Netherlands, Dordrecht
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

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