Identification of quantitative trait loci conferring resistance to tan spot in a biparental population derived from two Nebraska hard red winter wheat cultivars
Titel:
Identification of quantitative trait loci conferring resistance to tan spot in a biparental population derived from two Nebraska hard red winter wheat cultivars
Auteur:
Kariyawasam, Gayan K. Hussain, Waseem Easterly, Amanda Guttieri, Mary Belamkar, Vikas Poland, Jesse Venegas, Jorge Baenziger, Stephen Marais, Francois Rasmussen, Jack B. Liu, Zhaohui