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Journal description
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Details for article 2 of 10 found articles
| Title: |
Automated system for measuring electrophysical parameters of semiconductor structures |
| Author: |
Pecherskaya, E. A. Karpanin, O. V. Tuzova, D. E. Nelyutskov, M. A. Antipenko, V. V. |
| Appeared in: |
Measurement techniques |
| Paging: | Volume 66 () nr. 7 pages 508-515 |
| Year: |
2023-12-07 |
| Contents: | |
| Publisher: |
Springer US, New York |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 2 of 10 found articles
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