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Details for article 1 of 11 found articles
| Title: |
Adaptive Algorithms for Measuring the Parameters of Low-Frequency Noise of Semiconductor Devices Under the Conditions of Mass Control |
| Author: |
Sergeev, V. A. Rezchikov, S. E. |
| Appeared in: |
Measurement techniques |
| Paging: | Volume 63 () nr. 11 pages 910-916 |
| Year: |
2021-03-02 |
| Contents: | |
| Publisher: |
Springer US, New York |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 1 of 11 found articles
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