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Journal description
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Details for article 18 of 20 found articles
| Title: |
Study of a Pure-Ge/Si Short-Period Superlattice by X-Ray Double Crystal Diffraction |
| Author: |
Zhenguo Ji Huanming Lu Shiguo Zhang Duanlin Que N. Usami H. Sunamura Y. Shiraki |
| Appeared in: |
Journal of materials synthesis and processing |
| Paging: | Volume 07 (1999) nr. 3 pages 3 p. |
| Year: |
1999-05 |
| Contents: | |
| Publisher: |
Kluwer Academic/Plenum Publishers, New York, U.S.A. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 18 of 20 found articles
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