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Journal description
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Details for article 35 of 60 found articles
| Title: |
Interfacial and electrical characterizations of PEALD-grown AlN/4H-SiC MOS structure: a type-I heterojunction for enhanced blocking performance |
| Author: |
Guo, Yun-Duo Wang, An-Feng Huang, Qi-Min Wang, Zhen-Yu Ma, Hong-Ping Zhang, Qing-Chun |
| Appeared in: |
Journal of materials science. Materials in electronics |
| Paging: | Volume 36 () nr. 3 pages xx |
| Year: |
2025-01-25 |
| Contents: | |
| Publisher: |
Springer US, New York |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 35 of 60 found articles
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