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Comparative analysis of mechanical behavior between electroless and electroplated Ni layers and their influence on Si chip warpage |
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Titel: |
Comparative analysis of mechanical behavior between electroless and electroplated Ni layers and their influence on Si chip warpage |
Auteur: |
Qin, Hongbo Zhu, Shaohao Huang, Jian Tan, Quanzheng Lin, Jizhan Wang, Lili Lin, Guolin Liang, Caihang Huang, Jiaqiang |
Verschenen in: |
Journal of materials science. Materials in electronics |
Paginering: |
Jaargang 36 () nr. 21 pagina's xx |
Jaar: |
2025-07-25 |
Inhoud: |
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Uitgever: |
Springer US, New York |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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