The influence of Ni impurities on the structural phase of BiVO4 for enhanced binder-free voltammetric vanillin sensing, photocatalysis, and latent fingerprint studies
Titel:
The influence of Ni impurities on the structural phase of BiVO4 for enhanced binder-free voltammetric vanillin sensing, photocatalysis, and latent fingerprint studies
Auteur:
Soundarya, T. L. Prasad, B. T. Jyothi Sanjay, J. Nirmala, B. Shkir, Mohd Nagaraju, G. Harini, R.
Verschenen in:
Journal of materials science. Materials in electronics