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Microstructure, electrical conductivity, and stress relaxation resistance of Cu–0.3Be–0.5 Co alloy under heat treatment and two-stage cold rolling |
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Titel: |
Microstructure, electrical conductivity, and stress relaxation resistance of Cu–0.3Be–0.5 Co alloy under heat treatment and two-stage cold rolling |
Auteur: |
Wang, Jiahao Zheng, Xueqing Hu, Qiang Xu, Yinan Guan, Bo Xu, Jing Yu, Huihui Jiang, Chang Yi, Zhiqiang |
Verschenen in: |
Journal of materials science. Materials in electronics |
Paginering: |
Jaargang 36 () nr. 13 pagina's xx |
Jaar: |
2025-05-05 |
Inhoud: |
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Uitgever: |
Springer US, New York |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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