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Effect of thermal evolution of point defects on the electrical properties of nitrogen-implanted ZnO thin films |
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Titel: |
Effect of thermal evolution of point defects on the electrical properties of nitrogen-implanted ZnO thin films |
Auteur: |
Li, Wanjun Wang, Chunni Ma, Jianwen Zhang, Hong Xiong, Yuanqiang Li, Honglin Ye, Lijuan Ruan, Haibo Qin, Guoping Fang, Liang Kong, Chunyang |
Verschenen in: |
Journal of materials science. Materials in electronics |
Paginering: |
Jaargang 31 () nr. 5 pagina's 4208-4213 |
Jaar: |
2020-01-30 |
Inhoud: |
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Uitgever: |
Springer US, New York |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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