High thermal stability of RF dielectric properties of BiVO4 matrix with added ZnO
Titel:
High thermal stability of RF dielectric properties of BiVO4 matrix with added ZnO
Auteur:
Oliveira, R. G. M. Souza, D. C. de Morais, J. E. V. Batista, G. S. Silva, M. A. S. Gouveia, D. X. Trukhanov, S. Trukhanov, A. Panina, L. Singh, C. Zhou, D. Sombra, A. S. B.
Verschenen in:
Journal of materials science. Materials in electronics