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Far-IR transmittance and metal–insulator phase transition properties of VO2 films using Al2O3 as buffer layer |
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Titel: |
Far-IR transmittance and metal–insulator phase transition properties of VO2 films using Al2O3 as buffer layer |
Auteur: |
Yang, Renhui Wu, Zhiming Ji, Chunhui Wu, Xuefei Xiang, Zihao Zhang, Fan Li, Weizhi Wang, Jun Dong, Xiang Jiang, Yadong |
Verschenen in: |
Journal of materials science. Materials in electronics |
Paginering: |
Jaargang 30 (2019) nr. 7 pagina's 6448-6458 |
Jaar: |
2019 |
Inhoud: |
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Uitgever: |
Springer US, New York |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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