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Co-sputtering Co–Ti alloy as a single barrier/liner for Co interconnects and thermal stability enhancement using TiN metal capping |
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Titel: |
Co-sputtering Co–Ti alloy as a single barrier/liner for Co interconnects and thermal stability enhancement using TiN metal capping |
Auteur: |
Zhang, Dan Xu, Jing Mao, Shujuan Zhao, Chao Wang, Guilei Luo, Xue Li, Junfeng Li, Yongliang Wang, Wenwu Chen, Dapeng Ye, Tianchun Luo, Jun |
Verschenen in: |
Journal of materials science. Materials in electronics |
Paginering: |
Jaargang 30 (2019) nr. 11 pagina's 10579-10588 |
Jaar: |
2019 |
Inhoud: |
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Uitgever: |
Springer US, New York |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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