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Depth-resolved and temperature dependent analysis of phase formation processes in Cu–Zn–Sn–Se films on ZnO substrates |
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Titel: |
Depth-resolved and temperature dependent analysis of phase formation processes in Cu–Zn–Sn–Se films on ZnO substrates |
Auteur: |
Stroth, Christiane Sayed, Mohamed H. Schuster, Matthias Ohland, Jörg Hammer-Riedel, Ingo Hammer, Maria S. Wellmann, Peter Parisi, Jürgen Gütay, Levent |
Verschenen in: |
Journal of materials science. Materials in electronics |
Paginering: |
Jaargang 28 (2017) nr. 11 pagina's 7730-7738 |
Jaar: |
2017 |
Inhoud: |
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Uitgever: |
Springer US, New York |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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